The 3255B range of inductance analyzers are able to accurately characterise devices in a clear and simple manner. The inductance analyzers are available in three versions 3255BL (200kHz), 3255B (500kHz) and 3255BQ (1 MHz).
At the design stage of component development it is very important to analyse how components performs under different operating conditions. This includes operation over a range of frequencies, AC drive levels or DC bias currents.
The AC drive level can be set between 1 mV and 10 V. DC bias current can be set from 1 mA to 1 A internally (optional). Using the external 3265B range of DC Bias Units bias currents can be set to a maximum of 125 A.
Using the parallel Centronics interface the user can directly print all test results for further analysis and archiving.
In addition, via the optional GPIB interface, the instrument can be controlled from a PC and results can be read back for analysis and storage.
LabVIEW™ drivers are available on request or can be downloaded from the web site, www.waynekerrtest.com, providing a base from which a user can develop a specific test application.
The binning function allows component manufacturers to sort components in up to ten bins. Sorting is carried out either by absolute values or by percentage of values.
The 3255B and 3255BQ enable components to be measured at up to 125 A when optional 3265B DC Bias Units are used. Extended DC bias capability is also available with the 3255BL which uses the 3265B/5A or 3265B/10A to extend the DC bias current available to a maximum of 50A.
Up to five of the DC Bias Units can be used in parallel to give a wide range of DC bias currents.
Internal DC bias is available as an option giving DC bias currents from 1 mA to 1 A.
The 3265B has a number of safety and protection features including a safety interlock system to protect users against back EMFs. It is also fully protected against over temperature, excess voltage drop and sense lead failure.
With the addition of the 1009 DC Bias Fixture DC bias currents up to 50 A can be applied to an SMD inductor during component test in order to evaluate the devices thoroughly at operational bias currents. The fixture operates with one or two 3265B/25A Wayne Kerr DC bias units and a 3255B Inductance Analyzer. If two 3265B/25As are used then the optional 5-328-2005 high current lead set will be required.
Four rear panel mounted BNC connectors and two captive high current cables ensure simplicity and ease of use with a 3265B.
Interchangeable component test carriers ensure that the 1009 test fixture may be used with a wide variety of different devices. Blank carriers are available which enable device specific test fixtures to be developed or alternatively a carrier design and manufacturing service is available.
Stable component fixturing ensures high accuracy and repeatable measurements. Enclosed fixtures, with safety interlocks, minimises risk to operators.
4 Terminal component fixture, Remote test fixture for axial, radial or bandoliered components. Complete with cable terminating in four BNC connectors
4 Terminal Lead, 600 mm extension cable terminated with four BNC connectors at the instrument end and four individual crocodile clips at the component end.
SMD probe leads, The 1905A ead with two sprung needle probes is used to access surface mounted devices on circuit boards and for interfacing to hybrid components and chip components on tape.
SMD probe leads with 1023, The 1905X is a 4-2 BNC converter plus lead with two sprung needle probes to access surface mounted devices on circuit boards and for interfacing to hybrid components and chip components on tape.
Kelvin Clips (fine jaw), Wayne Kerr Kelvin Clips consist of a 0.6 m cable assembly terminated with four BNC connectors at the analyzer end and a pair of 4-terminal Kelvin clips at the Device Under Test end.
SMD Tweezers, Chip component tweezers for contacting leadless devices. The cable is terminated with BNC connectors.
Kelvin Clips, The 40150 is a price sensitive version of 1EVA40100 Fine Jaw Kelvin Clips for use with 4300 series LCR Meters
Kelvin Clips (large jaw), 600mm extension cable terminated with four BNC connectors at the instrument end and a pair of large jawed Kelvin clips at the component end.
2-Terminal 125A Fixture, The 1J1015 Conventional Body 2-Terminal High Current Fixture is used to connect a Wayne Kerr Analyzer (3255B or 3260B) and DC Bias Unit (3265B) system to a conventional body Device Under Test and pass up to 125 A DC bias current.
SMD 2-Terminal 125A Fixture, The 1J1016 SMD 2-Terminal High Current Fixture is used to connect a Wayne Kerr Analyzer (3255B or 3260B) and DC Bias Unit (3265B) system to a surface mount Device Under Test and pass up to 125 A DC bias current.
Dielectric Material Fixture, The 1020 Fixture is used with the 6500 series, and when used with the /K Materials Test firmware option allows the permittivity of the Material Under Test (MUT) to be calculated automatically.It allows both the Contacting Electrode and the Non-contacting Electrode Methods to be used up to a maximum frequency of 30 MHz.
SMD 4 Terminal Bottom Contact Fixture, The 10324 fixture makes a 4-terminal measurement to bottom contact surface mount devices and is especially suitable for low impedance devices.
DC Bias Current Unit, To evaluate components at high currents the 3265B/25A DC Bias Units may be used with either the Wayne Kerr 3255B Inductance Analyzer or the 3260B Precision Magnetics Analyzer. Bias current may be set from 25mA to 25A in steps of 25mA.